Title:
CONTROL SYSTEM, CONTROL DEVICE, AND DIAGNOSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2023/171596
Kind Code:
A1
Abstract:
The present invention relates to a control system, a control device, and a diagnosis method. The control device comprises: a first control unit which is connected with a sensor of a first sensor group through a first connector; and a second control unit which is connected with a sensor of a second sensor group through a second connector. When an abnormality of a first connector has been detected, the control device stops a fault diagnosis for each sensor of the first sensor group, and when an abnormality of a second connector has been detected, the control device stops a fault diagnosis for each sensor of the second sensor group.
Inventors:
SUMI TAICHIRO (JP)
MATSUOKA ATSUSHI (JP)
KIMURA MAKOTO (JP)
MATSUOKA ATSUSHI (JP)
KIMURA MAKOTO (JP)
Application Number:
PCT/JP2023/008225
Publication Date:
September 14, 2023
Filing Date:
March 06, 2023
Export Citation:
Assignee:
HITACHI ASTEMO LTD (JP)
International Classes:
G05B9/02; B60R16/02; G05B9/03
Foreign References:
| JP2021069233A | 2021-04-30 | |||
| JP2000265901A | 2000-09-26 | |||
| JP2018135920A | 2018-08-30 | |||
| JP2009208504A | 2009-09-17 | |||
| JP2004098848A | 2004-04-02 | |||
| US20220043018A1 | 2022-02-10 |
Attorney, Agent or Firm:
OGAWA, Moriaki et al. (JP)
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