Title:
CORRECTION EQUIPMENT, PROCESSING METHOD, AND PROCESSING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/218550
Kind Code:
A1
Abstract:
Correction equipment (100) comprises: an acquisition unit (110) that acquires normal generation information (11) and a plurality of sets of sensor information including first sensor information obtained by measuring a device (200); a normal data generation unit (120) that generates first waveform data on the basis of normal time-series data for the first sensor information, said normal time-series data being generated using the normal generation information (11) and sensor information other than the first sensor information; a waveform data generation unit (130) that generates second waveform data on the basis of time-series data of the first sensor information; an abnormality determination unit (140) that determines whether or not the device (200) is in an abnormal state using an abnormality determination model (12) that can receive input of the result of a comparison between the first waveform data and the second waveform data and output information relating to an abnormality in the device (200); a correction information generation unit (150) that generates correction information if the device (200) is in the abnormal state; and an output unit (160) that outputs the correction information.
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Inventors:
NASU OSAMU (JP)
Application Number:
PCT/JP2022/019918
Publication Date:
November 16, 2023
Filing Date:
May 11, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B9/02; G05B23/02
Domestic Patent References:
| WO2016195092A1 | 2016-12-08 | |||
| WO2019207767A1 | 2019-10-31 | |||
| WO2022054256A1 | 2022-03-17 |
Attorney, Agent or Firm:
YAMAGATA Yoichi et al. (JP)
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