Title:
CORRECTION METHOD AND APPARATUS FOR LARGE-FIELD-OF-VIEW HIGH-RESOLUTION LIGHT FIELD MICROSCOPIC SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/005671
Kind Code:
A1
Abstract:
The present application relates to the technical fields of computer graphics and computer vision. Provided are a correction method and apparatus for a large-field-of-view high-resolution light field microscopic system. The method comprises: acquiring light field images at a plurality of axial positions of a calibration target; acquiring a white light field image, which is not added to the calibration target; acquiring a noise image; processing the white light field image and the noise image, so as to obtain a light field decoding parameter; decoding the light field images by using the light field decoding parameter, so as to obtain four-dimensional light field data; and correcting the distortion of an imaging system by using the four-dimensional light field data, which corresponds to the light field images at the plurality of axial positions. By means of the present application comprising the solution, a large-field-of-view light field is corrected by using light field images of a calibration target at different axial positions, thereby alleviating the imaging distortion effect of the large-field-of-view light field, and improving a large-field-of-view high-resolution light field microscopic three-dimensional reconstruction result.
Inventors:
DAI QIONGHAI (CN)
WU JIAMIN (CN)
WU JIAMIN (CN)
Application Number:
PCT/CN2022/105493
Publication Date:
February 02, 2023
Filing Date:
July 13, 2022
Export Citation:
Assignee:
UNIV TSINGHUA (CN)
International Classes:
G06T5/00
Domestic Patent References:
| WO2020231640A1 | 2020-11-19 |
Foreign References:
| CN113327211A | 2021-08-31 | |||
| CN108776980A | 2018-11-09 | |||
| CN108093237A | 2018-05-29 | |||
| CN111951159A | 2020-11-17 | |||
| CN105654484A | 2016-06-08 |
Attorney, Agent or Firm:
TSINGYIHUA INTELLECTUAL PROPERTY LLC (CN)
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