Title:
CRA MEASUREMENT DEVICE AND CRA MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2024/106383
Kind Code:
A1
Abstract:
Provided is a CRA measurement technology that can be applied not only to optical systems that image but also to optical systems that do not image. This CRA measurement device 10 comprises: a module support device 20 for supporting an optical module 1; a pinhole device 30 disposed on the output side of the optical module 1 so as to receive an output light beam 5 outputted by the optical module 1, the pinhole device 30 having a pinhole 33 and outputting a partial light beam that passed through the pinhole 33 from among the output light beam 5; and an incidence angle measurement device 40 for measuring the CRA of the partial light beam that passed through the pinhole 33. The optical module 1 is capable of moving with respect to the pinhole 33 in a direction perpendicular to the optical axis OA1 of the optical module 1. The optical module 1 is capable of tilting the optical axis OA2 of the incidence angle measurement device 40 with respect to the optical axis OA1 of the optical module 1.
Inventors:
WAJIKI ATSUHIKO (JP)
ONO TAKAYOSHI (JP)
FUJIWARA SATOSHI (JP)
TSUTSUMI HIROKI (JP)
OBARA TAKASHI (JP)
NAGUMO NOBUTO (JP)
YAMASHITA RYUTARO (JP)
ONO TAKAYOSHI (JP)
FUJIWARA SATOSHI (JP)
TSUTSUMI HIROKI (JP)
OBARA TAKASHI (JP)
NAGUMO NOBUTO (JP)
YAMASHITA RYUTARO (JP)
Application Number:
PCT/JP2023/040790
Publication Date:
May 23, 2024
Filing Date:
November 13, 2023
Export Citation:
Assignee:
INTER ACTION CORP (JP)
International Classes:
G01M11/00; G01B11/26; G01M11/02
Foreign References:
| JP2010153413A | 2010-07-08 | |||
| JPH02173544A | 1990-07-05 | |||
| JP2021153254A | 2021-09-30 | |||
| JP2022164061A | 2022-10-27 | |||
| JP2022145349A | 2022-10-04 | |||
| JP2020186964A | 2020-11-19 | |||
| JP2000046535A | 2000-02-18 |
Attorney, Agent or Firm:
WILLFORT INTERNATIONAL PATENT FIRM (JP)
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