Title:
CRYSTAL-PHASE QUANTITATIVE ANALYSIS DEVICE, CRYSTAL-PHASE QUANTITATIVE ANALYSIS METHOD, AND CRYSTAL-PHASE QUANTITATIVE ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/031019
Kind Code:
A1
Abstract:
Provided is a crystal-phase quantitative analysis device capable of more easily performing quantitative analysis of a sample including a plurality of crystal phases. The crystal-phase quantitative analysis device is provided with: a means for acquiring powder diffraction patterns in a sample; a means for acquiring information about a plurality of crystal phases; a means for acquiring respective fitting functions for the plurality of crystal phases; a means for performing all-pattern fitting on the powder diffraction patterns by using the fitting functions and acquiring the result of the all-pattern fitting; and a means for calculating the weight ratio of the plurality of crystal phases on the basis of the result. Each of the fitting functions is selected from a group consisting of first fitting functions using integration intensities obtained by all-pattern decomposition, second fitting functions using integration intensities obtained by observation or calculation, and third fitting functions using profile intensities obtained by observation or calculation.
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Inventors:
TORAYA HIDEO (JP)
MUROYAMA NORIHIRO (JP)
MUROYAMA NORIHIRO (JP)
Application Number:
PCT/JP2018/019359
Publication Date:
February 14, 2019
Filing Date:
May 18, 2018
Export Citation:
Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/2055; G01N23/207
Foreign References:
| JP2014178203A | 2014-09-25 | |||
| JP2013122403A | 2013-06-20 | |||
| JP2008070331A | 2008-03-27 |
Other References:
HIDEO TORAYA: "A new method for quantitative phase analysis using X-ray powder diffraction: direct derivation of weight fractions from observed integrated intensities and chemical compositions of individual phases", J. APPL. CRYST., 2016, pages 1508 - 1516
HIDEO TORAYA: "Quantitative phase analysis using observed integrated intensities and chemical composition data of individual crystalline phases: quantification of materials with indefinite chemical compositions", J. APPL. CRYST., 2017, pages 820 - 829
ALEXANDER, L. E.KLUG, H. P., ANAL. CHEM., vol. 20, 1948, pages 886 - 889
CHUNG, F. H.: "Quantitative Interpretation of X-ray Diffraction Patterns of Mixtures. I. Matrix-Flushing Method for Quantitative Multicomponent Analysis", J. APPL. CRYST., 1974, pages 519 - 525
CHUNG, F. H.: "Quantitative Interpretation of X-ray Diffraction Patterns of Mixtures. II. Adiabatic Principle of X-ray Diffraction Analysis of Mixtures", J. APPL. CRYST., 1974, pages 526 - 531
WERNER, P.-E.SALOME, S.MALMROS, G.THOMAS, J. 0.: "Quantitative phase analysis of Multicomponent Powders by Full-Profile Refinement of Guinier-Hagg X-ray Film Data", J. APPL. CRYST., 1979, pages 107 - 109
HILL, R. J.HOWARD, C. J.: "Quantitative Phase Analysis from Neutron Powder Diffraction Data Using the Rietveld Method", J. APPL. CRYST., 1987, pages 467 - 474, XP055007071, DOI: 10.1107/S0021889887086199
TORAYA, H.TSUSAKA S.: "Quantitative Phase Analysis using the Whole-Powder-Pattern Decomposition Method. I. Solution from Knowledge of Chemical Compositions", J. APPL. CRYST., 1995, pages 392 - 399
SMITH, D. K.JOHNSON, G. G. JR.SCHEIBLE, A.WIMS, A. M.JOHNSON, J. L.ULLMANN, G.: "Quantitative X-Ray Powder Diffraction Method Using the Full Diffraction Pattern", POWER DIFFR., 1987, pages 73 - 77
SCARLETT, N. V. Y.MADSEN, I. C.: "Quantification of phases with partial or no known crystal structure", POWDER DIFFRACTION, 2006, pages 278 - 284, XP003034006, DOI: 10.1154/1.2362855
See also references of EP 3667304A4
HIDEO TORAYA: "Quantitative phase analysis using observed integrated intensities and chemical composition data of individual crystalline phases: quantification of materials with indefinite chemical compositions", J. APPL. CRYST., 2017, pages 820 - 829
ALEXANDER, L. E.KLUG, H. P., ANAL. CHEM., vol. 20, 1948, pages 886 - 889
CHUNG, F. H.: "Quantitative Interpretation of X-ray Diffraction Patterns of Mixtures. I. Matrix-Flushing Method for Quantitative Multicomponent Analysis", J. APPL. CRYST., 1974, pages 519 - 525
CHUNG, F. H.: "Quantitative Interpretation of X-ray Diffraction Patterns of Mixtures. II. Adiabatic Principle of X-ray Diffraction Analysis of Mixtures", J. APPL. CRYST., 1974, pages 526 - 531
WERNER, P.-E.SALOME, S.MALMROS, G.THOMAS, J. 0.: "Quantitative phase analysis of Multicomponent Powders by Full-Profile Refinement of Guinier-Hagg X-ray Film Data", J. APPL. CRYST., 1979, pages 107 - 109
HILL, R. J.HOWARD, C. J.: "Quantitative Phase Analysis from Neutron Powder Diffraction Data Using the Rietveld Method", J. APPL. CRYST., 1987, pages 467 - 474, XP055007071, DOI: 10.1107/S0021889887086199
TORAYA, H.TSUSAKA S.: "Quantitative Phase Analysis using the Whole-Powder-Pattern Decomposition Method. I. Solution from Knowledge of Chemical Compositions", J. APPL. CRYST., 1995, pages 392 - 399
SMITH, D. K.JOHNSON, G. G. JR.SCHEIBLE, A.WIMS, A. M.JOHNSON, J. L.ULLMANN, G.: "Quantitative X-Ray Powder Diffraction Method Using the Full Diffraction Pattern", POWER DIFFR., 1987, pages 73 - 77
SCARLETT, N. V. Y.MADSEN, I. C.: "Quantification of phases with partial or no known crystal structure", POWDER DIFFRACTION, 2006, pages 278 - 284, XP003034006, DOI: 10.1154/1.2362855
See also references of EP 3667304A4
Attorney, Agent or Firm:
HARUKA PATENT & TRADEMARK ATTORNEYS (JP)
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