Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
CULTURE MONITORING SYSTEM
Document Type and Number:
WIPO Patent Application WO/2007/145196
Kind Code:
A1
Abstract:
It is intended to provide a culture monitoring system which makes it possible to recognize in one glance the rough size of a cell observed under a microscope while continuing the cultivation. This culture monitoring system (S) has a culture unit (2) for constructing the environment suitable for culturing cells, an imaging device (3) for photographing a microscopic image of a cell, a display (4) for indicating the microscopic image thus photographed, and a computer (5) for controlling the indication on the display (4), wherein the computer (5) makes the indication in such a manner as giving a movable definite scale in the microscopic image indicated on the display (4).

Inventors:
NAKAMURA SHIGEYUKI (JP)
BUSUJIMA HIROKI (JP)
Application Number:
PCT/JP2007/061787
Publication Date:
December 21, 2007
Filing Date:
June 12, 2007
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SANYO ELECTRIC CO (JP)
NAKAMURA SHIGEYUKI (JP)
BUSUJIMA HIROKI (JP)
International Classes:
G02B21/36; C12M1/00; C12M1/34; C12M3/00; H04N5/225
Foreign References:
JP2006011415A2006-01-12
JPH0628724U1994-04-15
JPH08101354A1996-04-16
JPH09196621A1997-07-31
JP2000137158A2000-05-16
JP2006055027A2006-03-02
JP2006011415A2006-01-12
Other References:
See also references of EP 2031429A4
Attorney, Agent or Firm:
AMAGASA, Takashi (Hamacho Ota-sh, Gunma 53, JP)
Download PDF: