DATA ACQUISITION CHIP TEST SYSTEM AND DEVICE AND CONTROL METHOD THEREFOR

Title:

DATA ACQUISITION CHIP TEST SYSTEM AND DEVICE AND CONTROL METHOD THEREFOR

Document Type and Number:

WIPO Patent Application WO/2017/133185

Kind Code:

A1

Abstract:

A data acquisition chip test device (10) and a control method therefor. The test device (10) comprises: a data acquisition module (200) for receiving a plurality of frames of sampling data acquired by a data acquisition chip; a storage module (300); a processing module (400) for calculating noise of a plurality of data sampling points to obtain a noise test result; a data transceiving module (500) for uploading the noise test result; and a control module (600). The test device (10) calculates noise of a plurality of data sampling points so as to only need to upload a noise test result, so that the chip test efficiency is improved, the chip test cost is reduced, and the test reliability is better ensured.

Inventors:

QIN WEIHE (CN)
GUAN ZHOU (CN)
SONG HAIHONG (CN)
YANG LIAN (CN)

Application Number:

PCT/CN2016/089414

Publication Date:

August 10, 2017

Filing Date:

July 08, 2016

Export Citation:

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Assignee:

SHENZHEN GOODIX TECH CO LTD (CN)

International Classes:

G06F11/22; G01R29/26; G06V40/13

Foreign References:

CN101604273A	2009-12-16
CN102540060A	2012-07-04
EP1858028A1	2007-11-21
US7969168B1	2011-06-28
CN103472386A	2013-12-25

Other References: