Title:
DEBUG CAPABILITIES OF MEMORY SYSTEM WITH PIN
Document Type and Number:
WIPO Patent Application WO/2022/041216
Kind Code:
A1
Abstract:
Methods, systems, and devices for debug capabilities of a memory system with a pin are described. An apparatus may include a memory system that includes a plurality of pins of a first type that are configured to communicate information as part of operating the memory system and a pin of a second type. The apparatus may also include a circuit coupled with the memory system, the circuit including a resistor that is coupled with the pin of the second type. The memory system may include a controller that selects a value for the resistor and generates a code as part of a memory management operation to determine one or more operating conditions of the memory system based on selecting the value. The memory system controller may also determine an error associated with the code based on generating the code and the selected value of the resistor.
Inventors:
CHENG JINGWEI (US)
Application Number:
PCT/CN2020/112577
Publication Date:
March 03, 2022
Filing Date:
August 31, 2020
Export Citation:
Assignee:
MICRON TECHNOLOGY INC (US)
International Classes:
G11C29/12
Foreign References:
| US20180101424A1 | 2018-04-12 | |||
| CN111258842A | 2020-06-09 | |||
| US20120030153A1 | 2012-02-02 | |||
| US20180005686A1 | 2018-01-04 | |||
| US20180046541A1 | 2018-02-15 |
Attorney, Agent or Firm:
LEE AND LI-LEAVEN IPR AGENCY LTD. (CN)
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