Title:
DEFECT DETECTION METHOD AND APPARATUS FOR DEFECT IMAGE, AND COMPUTER-READABLE STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2021/168733
Kind Code:
A1
Abstract:
Provided are a defect detection method and apparatus for a defect image, and a computer-readable medium. The method comprises: acquiring a substrate image as a defect image to be subjected to detection; respectively performing defect detection on said defect image by using each defect detection algorithm in a defect detection algorithm set, and generating corresponding responses to obtain a defect detection response set, wherein the defect detection algorithm set comprises at least two defect detection algorithms; and determining, on the basis of the defect detection response set and the priorities of multiple candidate defect categories, a defect category of said defect image from the multiple candidate defect categories.
Inventors:
GUO YICHUAN (CN)
LU YUANYUAN (CN)
LI ZHAOYUE (CN)
CHAI DONG (CN)
WANG HONG (CN)
LU YUANYUAN (CN)
LI ZHAOYUE (CN)
CHAI DONG (CN)
WANG HONG (CN)
Application Number:
PCT/CN2020/076958
Publication Date:
September 02, 2021
Filing Date:
February 27, 2020
Export Citation:
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
International Classes:
G06T7/00; G01N21/88
Foreign References:
| CN104458755A | 2015-03-25 | |||
| US20150098655A1 | 2015-04-09 | |||
| CN109801286A | 2019-05-24 | |||
| CN106157303A | 2016-11-23 | |||
| CN108734696A | 2018-11-02 |
Attorney, Agent or Firm:
LIU, SHEN & ASSOCIATES (CN)
Download PDF: