Title:
DEFECT DETECTION METHOD, DEFECT DETECTION DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/002187
Kind Code:
A1
Abstract:
Embodiments of the present disclosure provide a defect detection method, a defect detection device, and a storage medium, which belong to the technical field of artificial intelligence. The defect detection method comprises: acquiring a target image set of a target to be analyzed, and determining whether target images in the target image set have suspected defect areas, wherein the suspected defect areas are areas of said target in which a defect could be present; acquiring target images having suspected defect areas so as to obtain a defect image set; inputting the defect image set into a trained classification network model and, by means of said model, performing recognition on suspected defect areas in the target images in the defect image set so as to obtain actual defect areas of the target images as well as corresponding actual defect types.
Inventors:
YAN PENG (CN)
Application Number:
PCT/CN2023/103337
Publication Date:
January 04, 2024
Filing Date:
June 28, 2023
Export Citation:
Assignee:
ZTE CORP (CN)
International Classes:
G06T7/00
Foreign References:
| CN112288727A | 2021-01-29 | |||
| CN111640091A | 2020-09-08 | |||
| CN113658121A | 2021-11-16 | |||
| EP3401672A1 | 2018-11-14 |
Attorney, Agent or Firm:
YUHONG INTELLECTUAL PROPERTY LAW FIRM (CN)
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