Title:
DEFECTIVE SITE INFERENCE SYSTEM, DEFECTIVE SITE INFERENCE METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2022/149597
Kind Code:
A1
Abstract:
A defective site inference system comprising: a control unit that controls a refrigerating and air-conditioning system, wherein the control unit outputs defect information about a site where a defect has occurred in the refrigerating and air-conditioning system, a candidate for a site where the defect has occurred, or a range in which the defect has occurred, using sensor information of a sensor that detects the defect, and installation position information about the position where at least one constituent element included in the refrigerating and air-conditioning system is installed.
Inventors:
HANADA TAKUYA (JP)
UEDA HIROKI (JP)
ISHIDA SATOSHI (JP)
UEDA HIROKI (JP)
ISHIDA SATOSHI (JP)
Application Number:
PCT/JP2022/000232
Publication Date:
July 14, 2022
Filing Date:
January 06, 2022
Export Citation:
Assignee:
DAIKIN IND LTD (JP)
International Classes:
F24F11/32; F24F11/36; F24F11/52
Foreign References:
| JP2012172912A | 2012-09-10 | |||
| JP2004127047A | 2004-04-22 | |||
| JP2018009772A | 2018-01-18 | |||
| JP2020197347A | 2020-12-10 | |||
| JP2013234797A | 2013-11-21 | |||
| JP2010134367A | 2010-06-17 | |||
| JP2017525732A | 2017-09-07 | |||
| JP2021001922A | 2021-01-07 |
Attorney, Agent or Firm:
ITOH, Tadashige et al. (JP)
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