Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
DELAY CALIBRATION APPARATUS AND DELAY CALIBRATION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/046141
Kind Code:
A1
Abstract:
Provided in the present disclosure is a delay calibration apparatus. The delay calibration apparatus comprises a delay calibration module, which comprises a coarse delay calibration unit and a precise delay calibration unit, wherein the coarse delay calibration unit is used for receiving an air interface pulse signal, and performing delay compensation on a channel associated pulse signal in a digital clock domain according to the air interface pulse signal; and the precise delay calibration unit comprises a precise delay calibration sub-unit and a phase calibration sub-unit, the precise delay calibration sub-unit being used for performing delay compensation on the channel associated pulse signal in an analog clock domain, and the phase calibration sub-unit being used for calibrating a clock domain phase. Also provided in the present disclosure is a delay calibration method. FIG. 1

Inventors:
YU HEJIE (CN)
HUANG XINXING (CN)
Application Number:
PCT/CN2023/113693
Publication Date:
March 07, 2024
Filing Date:
August 18, 2023
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
SANECHIPS TECH CO LTD (CN)
International Classes:
H04L5/00; H04J3/06
Foreign References:
CN110365317A2019-10-22
CN102457285A2012-05-16
CN101015022A2007-08-08
CN113364434A2021-09-07
CN109257033A2019-01-22
US20060178850A12006-08-10
Attorney, Agent or Firm:
TEE & HOWE INTELLECTUAL PROPERTY ATTORNEYS (CN)
Download PDF: