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Patent Searching and Data


Title:
DEPTH MEASUREMENT SYSTEM AND METHOD
Document Type and Number:
WIPO Patent Application WO/2021/103428
Kind Code:
A1
Abstract:
The present invention provides a depth measurement system and method. The system comprises: a transmitting module comprising a light source used for transmitting to a target object a pulsed beam with a power-time waveform modulated; an acquisition module comprising an image sensor consisting of at least one pixel and used for acquiring the pulsed beam reflected by the target object and generating a grayscale image; and a control and processing circuit used for providing a modulation signal required by the light source to emit the pulsed beam and controlling the duty ratio of the pulsed beam and a rising/falling edge time, at the same time controlling the acquisition module to receive the pulsed beam, and calculating the time of flight of the pulsed beam and/or the distance of the target object on the basis of the grayscale image, the duty ratio of the pulsed beam and the rising/falling edge time matching each other to reduce system errors. By setting the duty ratio of the pulsed beam and the rising/falling edge time that match each other, the system errors are reduced, thereby improving measurement accuracy.

Inventors:
MA XUAN (CN)
SUN FEI (CN)
SUN RUI (CN)
YANG SHEN WU (CN)
ZHOU XING (CN)
CUI DONGYAO (CN)
FANG ZHAO XIANG (CN)
WANG ZHAO MIN (CN)
Application Number:
PCT/CN2020/089780
Publication Date:
June 03, 2021
Filing Date:
May 12, 2020
Export Citation:
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Assignee:
SHENZHEN ORBBEC CO LTD (CN)
International Classes:
G01S17/10; G01S7/484; G01S17/89
Foreign References:
CN111025315A2020-04-17
CN110456379A2019-11-15
CN206023725U2017-03-15
CN106574974A2017-04-19
CN109375193A2019-02-22
JP2017116314A2017-06-29
Attorney, Agent or Firm:
CHINA TRUER IP (CN)
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