Title:
DETERIORATION DETECTION METHOD, DETERIORATION DETECTION PROGRAM, AND INFORMATION PROCESSING DEVICE
Document Type and Number:
WIPO Patent Application WO/2021/079478
Kind Code:
A1
Abstract:
An accuracy deterioration detection device acquires a first output result at a time when input data is input to a learned model, and acquires a second output result at a time when the input data is input to a detection model, which is for detecting performance deterioration of the learned model. The accuracy deterioration detection device calculates a first coincidence result acquired by comparing the first output result and the second output result in a first period. The accuracy deterioration detection device calculates a second coincidence result acquired by comparing the first output result and the second output result in a second period different from the first period. The accuracy deterioration detection device uses the first coincidence result and the second coincidence result to output a change in accuracy deterioration of the learned model.
Inventors:
YOKOTA YASUTO (JP)
Application Number:
PCT/JP2019/041792
Publication Date:
April 29, 2021
Filing Date:
October 24, 2019
Export Citation:
Assignee:
FUJITSU LTD (JP)
International Classes:
G06N20/00
Domestic Patent References:
| WO2016152053A1 | 2016-09-29 |
Other References:
SAKAMOTO, YUSUKE ET AL.: "Examination of Non-Data-Distribution-Dependent Concept Drift Detection Method in Unsupervised Learning", IPSJ SIG TECHNICAL REPORT, vol. 2015 -MP, no. 6, 24 February 2015 (2015-02-24), pages 1 - 6, Retrieved from the Internet [retrieved on 20191220]
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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