Title:
DEVICE FOR DETECTING DEFECTS OF WEB
Document Type and Number:
WIPO Patent Application WO/1992/012410
Kind Code:
A1
Abstract:
A device for detecting defects of web includes a plurality of probes (3) arranged to come in contact with a web (1) on a carrier path of the web (1) which consists of a slit sheet or a nonwoven fabric, and a detector means (6b) provided under the web. The probes (3) are rotatably supported. They roll along the web surface and dip at defective portions of the web (1). When the probes (3) dip and protrude downwardly through the web, the detector means (6b) generates defect detection signals. The above defect detection device can be used for detecting cracks and portions lacking strength of the web.
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Inventors:
AIHARA KINTARO (JP)
YAMAZAKI SHINJI (JP)
YAMAZAKI SHINJI (JP)
Application Number:
PCT/JP1992/000013
Publication Date:
July 23, 1992
Filing Date:
January 10, 1992
Export Citation:
Assignee:
NIPPON PETROCHEMICALS CO LTD (JP)
POLYMER PROCESSING RES INST (JP)
POLYMER PROCESSING RES INST (JP)
International Classes:
B65H63/00; D06H3/08; D06H3/10; G01N19/04; G01N19/08; G01N21/89; G01N21/892; G01N33/36; G01N3/02; (IPC1-7): D06H3/08; G01N19/00; G01N19/08
Foreign References:
JPS5276055A | 1977-06-25 | |||
JPS5020715Y1 | 1975-06-23 |
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