DEVICE FOR DETECTING FOREIGN MATTER AND METHOD FOR DETECTING FOREIGN MATTER

WIPO Patent Application WO/2012/108306

A1

The present invention provides a device for detecting foreign matter and a method for detecting foreign matter on the surface of an object or included within the object, the object being a film of an electrode mixture or the like, and thereby improving the reliability of the object under inspection. The object is irradiated with terahertz illuminating light (100) (4 µm-10 mm wavelength), whereupon scattered light (660) from the object, for example, an electrode (10), is detected in the form of a signal by an optical scatter detector (200), to thereby detect foreign matter, for example, metal foreign matter (720), on the surface of the electrode (10) or included within the electrode (10). The electrode (10) is formed by coating both faces of a collector (710) with an electrode mixture layer (700) containing an active material (701), a conductive auxiliary, and a binder as constituent elements. The scattered light (660) is generated by reflection of a portion of transmitted light (656) by the metal foreign matter (720).

AIKO KENJI (JP)
TANAKA SHIGEYA (JP)
AOKI YASUKO (JP)
KAWAGUCHI HIROSHI (JP)
SHIMURA KEI (JP)

PCT/JP2012/052206

August 16, 2012

February 01, 2012

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HITACHI HIGH TECH CORP (JP)
AIKO KENJI (JP)
TANAKA SHIGEYA (JP)
AOKI YASUKO (JP)
KAWAGUCHI HIROSHI (JP)
SHIMURA KEI (JP)

G01N21/94; G01B11/30; G01N21/27; G01N21/35; H01M4/139

JP2006071412A	2006-03-16
JP2009300279A	2009-12-24
JP2010019647A	2010-01-28
JP2007199044A	2007-08-09
JP2005172774A	2005-06-30
JPH06201601A	1994-07-22
JPH08297086A	1996-11-12
JP2008026190A	2008-02-07
JPH04194736A	1992-07-14
JP2009204605A	2009-09-10

POLAIRE I. P. C. (JP)
Polaire Intellectual Property Corporation (JP)

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