Title:
DEVICE FOR MEASURING THREE-DIMENSIONAL SHAPE AND METHOD FOR MEASURING SAME
Document Type and Number:
WIPO Patent Application WO/2018/066868
Kind Code:
A1
Abstract:
The present invention relates to a device for measuring a three-dimensional shape and a method for measuring the same. A device for measuring a three-dimensional shape according to an embodiment of the present invention comprises: an image control portion comprising a camera for controlling, in connection with a target object to be measured, a variable magnification image of the target object; an image/signal control means comprising an inspection grid pattern portion for setting the type and number of reference magnification images and reference grid patterns projected onto the target object, generating a variable magnification image and a variable magnification grid pattern for precise three-dimensional measurement, and moving the position of a minimum grid pattern such that, by generating a sub grid pattern, inspection grid patterns are generated; a pattern signal generating portion for receiving the inspection grid pattern information and generating a signal waveform for conducting a control such that line light is projected onto the target object according to the inspection grid pattern information; a grid pattern projecting means comprising a pattern projecting portion for generating a grid pattern shape comprising at least one line pattern projected into the target object; an image input means for receiving an image at a cycle synchronized with a two-dimensional grid pattern projected onto the target object; an information processing means for storing the two-dimensional grid patterns generated successively, synthesizing a three-dimensional image using the stored two-dimensional grid patterns, and extracting three-dimensional coordinates; and an output means for displaying initiation of the three-dimensional measurement and image information. The line pattern is generated in the following manner: the line light generates laser light by means of a signal waveform, the laser light is converted into line light by a lens, and the same is reflected at the surface of a micromirror. While an MEMS one-dimensional micromirror rotates by a predetermined angle with reference to a single axis, the line pattern can be controlled such that the line light is generated by controlling the point of time at which a signal waveform is generated, and the line light is emitted to the surface of the one-dimensional micromirror.
Inventors:
LEE KEYONG JA (KR)
CHOI SU YEON (KR)
CHOI SU HEYONG (KR)
CHOI SU YEON (KR)
CHOI SU HEYONG (KR)
Application Number:
PCT/KR2017/010667
Publication Date:
April 12, 2018
Filing Date:
September 27, 2017
Export Citation:
Assignee:
LEE KEYONG JA (KR)
CHOI SU YEON (KR)
CHOI SU HEYONG (KR)
CHOI SU YEON (KR)
CHOI SU HEYONG (KR)
International Classes:
G01B11/25; H04N5/232
Foreign References:
| KR20120098131A | 2012-09-05 | |||
| JP2014219301A | 2014-11-20 | |||
| JPH05248831A | 1993-09-28 | |||
| KR101562467B1 | 2015-10-23 | |||
| KR101628158B1 | 2016-06-09 |
Attorney, Agent or Firm:
LEE, Jae Man (KR)
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