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Patent Searching and Data


Title:
DEVICE AND METHOD FOR MEASURING TEMPERATURE OF HEAT-TREATED PRODUCT
Document Type and Number:
WIPO Patent Application WO/2012/118016
Kind Code:
A1
Abstract:
This device is provided with: a measurement window (32) which is arranged in a heat treatment furnace (10) and through which a surface (1a) to be measured of a heat-treated product (1) can be observed directly; and a temperature sensor (32) which is arranged outside the measurement window and can measure the surface temperature of the surface (1a) to be measured in a non-contact manner through the measurement window. The temperature sensor (32) has a measurement wavelength range which can be absorbed by water at a low absorption rate (e.g., 1.95-2.5 μm). The measurement window (32) is composed of a window material that exhibits a high transmittance in the above-mentioned measurement wavelength range (e.g., germanium).

Inventors:
KATSUMATA KAZUHIKO (JP)
INOUE JUNJI (JP)
SHIMADA TAKAHISA (JP)
KUDO SHINYA (JP)
UEDA AMI (JP)
Application Number:
PCT/JP2012/054793
Publication Date:
September 07, 2012
Filing Date:
February 27, 2012
Export Citation:
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Assignee:
IHI CORP (JP)
IHI MACHINERY & FURNACE CO LTD (JP)
KATSUMATA KAZUHIKO (JP)
INOUE JUNJI (JP)
SHIMADA TAKAHISA (JP)
KUDO SHINYA (JP)
UEDA AMI (JP)
International Classes:
F27D21/00; C21D1/00; F27D9/00; F27D21/02; G01J5/00; G01J5/06; C21D1/667
Foreign References:
JP2010249332A2010-11-04
JPS63288041A1988-11-25
JP2010002150A2010-01-07
JP2007171112A2007-07-05
JPH09316544A1997-12-09
JPH11153386A1999-06-08
Attorney, Agent or Firm:
HOTTA MINORU (JP)
Minoru Hotta (JP)
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Claims: