Title:
DIAMOND SINTERED BODY, AND TOOL COMPRISING DIAMOND SINTERED BODY
Document Type and Number:
WIPO Patent Application WO/2022/085161
Kind Code:
A1
Abstract:
This diamond sintered body includes diamond particles, wherein the content of the diamond particles is 80 vol% to 99 vol% with respect to the diamond sintered body, the average particle diameter of the diamond particles is 0.1 μm to 50 μm, and the dislocation density of the diamond particles is 1.2×1016 m-2 to 5.4×1019m-2.
Inventors:
IWASAKI HIROTSUGU (JP)
UEDA AKIHIKO (JP)
MATSUKAWA MICHIKO (JP)
KUKINO SATORU (JP)
UEDA AKIHIKO (JP)
MATSUKAWA MICHIKO (JP)
KUKINO SATORU (JP)
Application Number:
PCT/JP2020/039755
Publication Date:
April 28, 2022
Filing Date:
October 22, 2020
Export Citation:
Assignee:
SUMITOMO ELECTRIC HARDMETAL CORP (JP)
SUMITOMO ELECTRIC INDUSTRIES (JP)
SUMITOMO ELECTRIC INDUSTRIES (JP)
International Classes:
B01J3/06; B23B27/20; C01B32/25; C04B35/52
Foreign References:
| JP2005239472A | 2005-09-08 | |||
| JPH0197503A | 1989-04-17 | |||
| JP2009518259A | 2009-05-07 | |||
| JP2005239472A | 2005-09-08 |
Other References:
SAMSONENKO, S. N. ET AL.: "Electrical Conductivity of Synthetic Diamond Films", SEMICONDUCTORS, vol. 43, no. 5, 2009, pages 594 - 598, XP019692055
SHINICHI SHIKATA, EIICHI KAMEI, KOJI YAMAGUCHI, NAOYA AKASHI: "Flaw evaluation of ultra-low resistance diamonds for powered devices", ANNUAL REPORT OF THE KYUSHU SYNCHROTRON LIGHT RESEARCH CENTER, vol. 2016, no. 4, 30 November 2017 (2017-11-30), Tosu (Japan), pages 14 - 16, XP009543825, ISSN: 1881-3402
T. UNGARA. BORBELY: "The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis", APPL. PHYS. LETT., vol. 69, no. 21, 1996, pages 3173, XP012016627, DOI: 10.1063/1.117951
T. UNGARS. OTTP. SANDERSA. BORBELYJ. WEERTMAN: "Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis", ACTA MATER, vol. 46, no. 10, 1998, pages 3693 - 3699, XP027395830
See also references of EP 4234135A4
SHINICHI SHIKATA, EIICHI KAMEI, KOJI YAMAGUCHI, NAOYA AKASHI: "Flaw evaluation of ultra-low resistance diamonds for powered devices", ANNUAL REPORT OF THE KYUSHU SYNCHROTRON LIGHT RESEARCH CENTER, vol. 2016, no. 4, 30 November 2017 (2017-11-30), Tosu (Japan), pages 14 - 16, XP009543825, ISSN: 1881-3402
T. UNGARA. BORBELY: "The effect of dislocation contrast on x-ray line broadening: A new approach to line profile analysis", APPL. PHYS. LETT., vol. 69, no. 21, 1996, pages 3173, XP012016627, DOI: 10.1063/1.117951
T. UNGARS. OTTP. SANDERSA. BORBELYJ. WEERTMAN: "Dislocations, grain size and planar faults in nanostructured copper determined by high resolution X-ray diffraction and a new procedure of peak profile analysis", ACTA MATER, vol. 46, no. 10, 1998, pages 3693 - 3699, XP027395830
See also references of EP 4234135A4
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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