Title:
DIELECTRIC SPECTROSCOPIC MEASUREMENT DEVICE AND DIELECTRIC SPECTROSCOPIC MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2022/168250
Kind Code:
A1
Abstract:
The present invention comprises: a signal generation unit that generates electromagnetic waves; a signal splitting unit that splits the electromagnetic waves according to transmission direction, and outputs the split electromagnetic waves to output destinations corresponding to the transmission directions; a changeover switch unit that takes in, via the signal splitting unit, the electromagnetic waves generated by the signal generation unit, outputs the taken in electromagnetic waves while switching output destination, and outputs, to the signal splitting unit, electromagnetic waves returning from the output destinations; a sensor unit that irradiates a measurement subject with electromagnetic waves outputted by the changeover switch unit, and outputs, to the changeover switch unit, measurement subject waves obtained by said irradiation; a calibration standard unit that is provided with a circuit for a calibration standard, said circuit outputting, to the changeover switch unit, reflection waves for calibration that are generated by receiving electromagnetic waves outputted by the changeover switch unit; a signal reception unit that receives the measurement subject waves and the reflection waves for calibration via the signal splitting unit; and a computation unit that takes in a measured value outputted by the signal reception unit which has received the measurement subject waves and the reflection waves for calibration, and corrects the taken in measured value for the measurement subject on the basis of a measured value corresponding to the taken in reflection waves for calibration.
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Inventors:
NAKAMURA MASAHITO (JP)
TAJIMA TAKURO (JP)
SEYAMA MICHIKO (JP)
TAJIMA TAKURO (JP)
SEYAMA MICHIKO (JP)
Application Number:
PCT/JP2021/004219
Publication Date:
August 11, 2022
Filing Date:
February 05, 2021
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G01N22/00
Foreign References:
| JPH0843463A | 1996-02-16 | |||
| JP2005121422A | 2005-05-12 | |||
| JP2018096806A | 2018-06-21 | |||
| JP2001272428A | 2001-10-05 | |||
| JP2003075369A | 2003-03-12 | |||
| JPH11211766A | 1999-08-06 | |||
| US20160128602A1 | 2016-05-12 | |||
| JP2013032933A | 2013-02-14 |
Other References:
HOFMANN, MAXIMILIAN: "Microwave-Based Noninvasive Concentration Measurements for Biomedical Applications", IEEE TRANSACTIONS ON MICROWAVE THEORY AND THCHNIQUES, vol. 61, no. 5, May 2013 (2013-05-01), pages 2195 - 2204, XP055464102, DOI: 10.1109/TMTT.2013.2250516
M. HOFMANNG. FISCHERR. WEIGELD. KISSINGER: "Microwave-Based Noninvasive Concentration Measurements for Biomedical Applications", IEEE TRANS. MICROWAVE THEORY AND TECHNIQUES, vol. 61, no. 5, 2013, pages 2195 - 2204
J P. GRANTR N. CLARKEG T. SYMMN M. SPYROU: "A critical study of the open-ended coaxial line sensor technique for RF and microwave complex permittivity measurements", J. PHYS. E: SCI. INSTRUM, vol. 22, 1989, pages 757 - 770
T.P. MARSLANDS. EVANS: "Dielectric measurements with an open-ended coaxial probe", IEE PROCEEDINGS, vol. 134, no. 4, 1987, pages 341 - 349
ANDREJ RUMIANTSEVN.M. RIDLE: "VNA Calibration", IEEE MICROWAVE MAGAZINE, IEEE XPLORE, vol. 9, no. 3, June 2008 (2008-06-01), pages 86 - 99, XP011214626
M. HOFMANNG. FISCHERR. WEIGELD. KISSINGER: "Microwave-Based Noninvasive Concentration Measurements for Biomedical Applications", IEEE TRANS. MICROWAVE THEORY AND TECHNIQUES, vol. 61, no. 5, 2013, pages 2195 - 2204
J P. GRANTR N. CLARKEG T. SYMMN M. SPYROU: "A critical study of the open-ended coaxial line sensor technique for RF and microwave complex permittivity measurements", J. PHYS. E: SCI. INSTRUM, vol. 22, 1989, pages 757 - 770
T.P. MARSLANDS. EVANS: "Dielectric measurements with an open-ended coaxial probe", IEE PROCEEDINGS, vol. 134, no. 4, 1987, pages 341 - 349
ANDREJ RUMIANTSEVN.M. RIDLE: "VNA Calibration", IEEE MICROWAVE MAGAZINE, IEEE XPLORE, vol. 9, no. 3, June 2008 (2008-06-01), pages 86 - 99, XP011214626
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
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