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Title:
DIELECTRIC SPECTROSCOPY MEASUREMENT DEVICE AND METHOD
Document Type and Number:
WIPO Patent Application WO/2021/205503
Kind Code:
A1
Abstract:
This dielectric spectroscopy measurement device comprises a first probe (101), a second probe (102), and a measuring instrument (103). The first probe (101) is configured from a coaxial line and has one end that is an open end and serves as a detection end (101a). The second probe (102) is configured from a coaxial line and has one end that is an open end and serves as a detection end (102a). Moreover, the second probe (102) has a longer penetration length than that of the first probe (101). The measurement instrument (103) uses the result of measuring an object under measurement using the first probe (101) and the result of measuring the object under measurement using the second probe (102) to determine the permittivity of a second medium (152).

Inventors:
NAKAMURA MASAHITO (JP)
SEYAMA MICHIKO (JP)
Application Number:
PCT/JP2020/015498
Publication Date:
October 14, 2021
Filing Date:
April 06, 2020
Export Citation:
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Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G01N22/00; G01N21/3581
Foreign References:
JPH10137193A1998-05-26
JP2005514996A2005-05-26
US20090204346A12009-08-13
JP2002228600A2002-08-14
JPH08320297A1996-12-03
Attorney, Agent or Firm:
YAMAKAWA, Shigeki et al. (JP)
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