Title:
DIRECT TEMPERATURE MEASUREMENT OVEN CONTROLLED CRYSTAL OSCILLATOR
Document Type and Number:
WIPO Patent Application WO/2017/015835
Kind Code:
A1
Abstract:
A direct temperature measurement oven controlled crystal oscillator, which relates to the technical field of quartz crystal oscillators. An extra component for measuring the temperature of a wafer does not need to be assembled inside the crystal oscillator, and a temperature measurement device (6) is disposed on the surface of the wafer (3) to directly measure the temperature of the wafer (3), so that the temperature of the wafer (3) is accurately measured. The oven controlled crystal oscillator has a simple structure, is easy to produce and manufacture, and directly measures the temperature of the wafer, thereby making the temperature measurement more precise.
Inventors:
WANG YIFENG (CN)
LIU CHAOSHENG (CN)
LIU CHAOSHENG (CN)
Application Number:
PCT/CN2015/085207
Publication Date:
February 02, 2017
Filing Date:
July 27, 2015
Export Citation:
Assignee:
GUANGDONG DAPU TELECOM TECH CO LTD (CN)
International Classes:
H03B5/04
Foreign References:
| US20090051447A1 | 2009-02-26 | |||
| CN1581677A | 2005-02-16 | |||
| CN101834562A | 2010-09-15 | |||
| CN201118527Y | 2008-09-17 | |||
| US20090212878A1 | 2009-08-27 |
Attorney, Agent or Firm:
BEYOND ATTORNEYS AT LAW (CN)
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