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Patent Searching and Data


Title:
DISPLAY DEVICE INSPECTION METHOD, AND INFORMATION PROCESSING DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/095416
Kind Code:
A1
Abstract:
This display device inspection method, which employs machine learning to determine to which of j classification types an image obtained by imaging an image display screen of the display device corresponds, includes a first machine learning step in which an information processing device performs machine learning for determining to which of the j classification types the image corresponds, on the basis of teacher data including data relating to images corresponding to the j classification types, prepared in advance, and a second machine learning step in which the information processing device performs machine learning for determining to which of k classification types among the j classification types the image corresponds, on the basis of teacher data including data relating to images corresponding to the k classification types, wherein j and k are natural numbers at least equal to 2, and k is smaller than j.

Inventors:
TOMITA SATORU (JP)
Application Number:
PCT/JP2022/033674
Publication Date:
June 01, 2023
Filing Date:
September 08, 2022
Export Citation:
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Assignee:
JAPAN DISPLAY INC (JP)
International Classes:
G01N21/88; G06N20/00; G06T7/00
Domestic Patent References:
WO2020012523A12020-01-16
Foreign References:
JP2020112456A2020-07-27
JP2020528996A2020-10-01
KR20170127269A2017-11-21
JP2021033564A2021-03-01
JP2021148678A2021-09-27
JP2015038441A2015-02-26
CN111044525A2020-04-21
JP2020071582A2020-05-07
JP2009103508A2009-05-14
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
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