Title:
DISPLAY PANEL MOTHERBOARD, TEST METHOD FOR DISPLAY PANEL MOTHERBOARD, AND DISPLAY PANEL
Document Type and Number:
WIPO Patent Application WO/2023/216342
Kind Code:
A1
Abstract:
A display panel motherboard (100), a test method for the display panel motherboard (100), and a display panel (200). The display panel motherboard (100) comprises a display area (110) and a test area (120); the display area (110) comprises display panel main bodies (111); signal input ends (112) are provided on the display panel main bodies (111); the test area (120) comprises a first signal end (121) and a control circuit (122); and the control circuit (122) controls a signal channel between the first signal end (121) and each signal input end (112) to be turned on or turned off, such that the range of defective products can be narrowed, and the testing efficiency is improved.
Inventors:
LI FEI (CN)
Application Number:
PCT/CN2022/096456
Publication Date:
November 16, 2023
Filing Date:
May 31, 2022
Export Citation:
Assignee:
WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECH CO LTD (CN)
International Classes:
G09G3/00
Foreign References:
| CN113643636A | 2021-11-12 | |||
| CN201051368Y | 2008-04-23 | |||
| US8614591B2 | 2013-12-24 | |||
| CN107678219A | 2018-02-09 | |||
| CN113986036A | 2022-01-28 | |||
| CN113721093A | 2021-11-30 | |||
| CN105096785A | 2015-11-25 |
Attorney, Agent or Firm:
PURPLEVINE INTELLECTUAL PROPERTY (SHENZHEN) CO., LTD. (CN)
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