Title:
ELECTRODE ARRANGEMENT FOR TESTING ELECTROLUMINESCENT DISPLAY
Document Type and Number:
WIPO Patent Application WO2005034584
Kind Code:
A9
Abstract:
An apparatus for improving testability of electroluminescent displays (ELDs) is provided, incorporating at least two sets of electrodes, one set for connecting rows of pixels, and a second set for connecting columns of pixels, wherein at least one electrode set is interleaved in two subsets. The first subset has electrode extensions of a first length, and the second subset has electrode extensions of a second, shorter, length. A first connector is disposed generally in a direction perpendicular to the electrode extensions of both subsets and in electrical contact with the electrode extensions of the second subset. A second connector is disposed generally in a direction perpendicular to the electrode extensions of the first subset, and in electrical contact with the electrode extensions of only the first subset. A set of insulating patches separate the electrode extensions of the first subset from the first connector. The apparatus of the present invention restricts overvoltage during connection/disconnection of test apparatus.
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Inventors:
ABE HISASHI (JP)
LUKE DEREK (CA)
LUKE DEREK (CA)
Application Number:
PCT/CA2004/001716
Publication Date:
October 27, 2005
Filing Date:
September 21, 2004
Export Citation:
Assignee:
IFIRE TECHNOLOGY CORP (CA)
SANYO ELECTRIC CO (JP)
ABE HISASHI (JP)
LUKE DEREK (CA)
SANYO ELECTRIC CO (JP)
ABE HISASHI (JP)
LUKE DEREK (CA)
International Classes:
G09G3/30; H01J1/62; H01J63/04; H05B33/12; (IPC1-7): H05B33/12; G09G3/30
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