ELECTRODE FOR ELECTROCHEMICAL MEASUREMENT, ELECTROLYSIS CELL FOR ELECTROCHEMICAL MEASUREMENT, ANALYZER FOR ELECTROCHEMICAL MEASUREMENT, AND METHODS FOR PRODUCING SAME

Title:

ELECTRODE FOR ELECTROCHEMICAL MEASUREMENT, ELECTROLYSIS CELL FOR ELECTROCHEMICAL MEASUREMENT, ANALYZER FOR ELECTROCHEMICAL MEASUREMENT, AND METHODS FOR PRODUCING SAME

Document Type and Number:

WIPO Patent Application WO/2012/077660

Kind Code:

A1

Abstract:

Provided are an electrode, an electrolysis cell, and an electrochemical analyzer that improve the long-term stability of analytical data. A working electrode (2), a counter electrode (3), and a reference electrode (4) are disposed in an electrolysis cell (1). The working electrode is obtained by forming a lead wire in a composite material having platinum or a platinum alloy as a base material, in which a metal oxide is dispersed, or in a laminated material obtained by laminating a valve metal and platinum such that the cross sectional crystal structure in the thickness direction of the platinum part is formed in layers with respect to the electrode surface and the thickness of each layer of the platinum part is 5 micrometers or thinner. The metal oxide is selected from among zirconium oxide, tantalum oxide, and niobium oxide, and the metal oxide content of the platinum or platinum alloy is 0.005 to 1 wt% in terms of the zirconium, tantalum, or niobium metal. When the crystal orientation rate (%) of the electrode surface as obtained by X-ray diffraction is I(hkl)/ΣI(hkl)x 100 (where I(hkl) is the integrated value of the diffraction intensity of each face and ΣI(hkl) is the sum of the integrated values of the diffraction intensity of (hkl)), one of the resulting crystals orientation rates is 80% or greater.

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Inventors:

KANEMOTO HIROSHI (JP)
AKAHOSHI HARUO (JP)
OGUCHI SO (JP)
IMAI KENTA (JP)
SAKAZUME TAKU (JP)
YOSHIDA HIROSHI (JP)

Application Number:

PCT/JP2011/078137

Publication Date:

June 14, 2012

Filing Date:

December 06, 2011

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)
KANEMOTO HIROSHI (JP)
AKAHOSHI HARUO (JP)
OGUCHI SO (JP)
IMAI KENTA (JP)
SAKAZUME TAKU (JP)
YOSHIDA HIROSHI (JP)

International Classes:

G01N27/28; G01N27/30

Other References:

TAKEKAZU ISE ET AL.: "Bunsan Mekkiho ni yoru Ti02-Pt Fukugo Denkyoku no Hikari Denki Kagakuteki Kyodo", TOHOKU INSTITUTE OF TECHNOLOGY KIYO 1 RIKOGAKU HEN, March 1987 (1987-03-01), pages 31 - 38, XP008170253

Attorney, Agent or Firm:

ASAMURA PATENT OFFICE, p. c. (JP)
Patent business corporation Asamura patent firm (JP)

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Claims:

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