Title:
ELECTRONIC APPARATUS VALUE EVALUATION DEVICE AND OPERATION METHOD THEREOF
Document Type and Number:
WIPO Patent Application WO/2024/076223
Kind Code:
A1
Abstract:
Disclosed is an electronic apparatus value evaluation device. One embodiment can: acquire an analysis result of a deep learning evaluation model (here, the analysis result includes whether the deep learning evaluation model has detected a first defect in the external appearance of a target electronic apparatus on the basis of an external appearance image of the target electronic apparatus); determine, on the basis of a preset range of the first defect and probability data on the first defect, whether the acquired analysis result is appropriate (here, the probability data is based on how many times the first defect was detected in electronic apparatuses of the same model as the target electronic apparatus among electronic apparatuses imaged in an imaging box); and if the acquired analysis result is determined to be inappropriate, perform at least one of operations for solving problems, wherein the operations enable the deep learning evaluation model to derive the analysis result.
Inventors:
YOO KWANG YEOL (KR)
Application Number:
PCT/KR2023/095059
Publication Date:
April 11, 2024
Filing Date:
October 04, 2023
Export Citation:
Assignee:
MINTIT CO LTD (KR)
International Classes:
G01N21/88; G06N3/08; G06T7/00
Attorney, Agent or Firm:
MUHANN PATENT & LAW FIRM (KR)
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