ELECTRONIC-COMPONENT INSPECTION DEVICE

WIPO Patent Application WO/2015/194048

A1

This invention provides an electronic-component inspection device that, after inspecting and classifying an electronic component, can use the results of that inspection to perform re-inspection and reclassification, reducing the overkill rate or minimizing quality variability. Observation-result information (i1) for an electronic component is analyzed to determine whether said electronic component is acceptable or defective, and on the basis of determination information (i2), the electronic component is classified into a container corresponding to the quality of said electronic component. Identifying information (i3) indicating the position of the electronic component inside the container into which said electronic component was classified is generated and associated with the observation-result information (i1). The quality of the electronic component is re-determined on the basis of said observation-result information (i1), and the result of the re-determination is further associated with the identifying information (i3) associated with the observation-result information (i1). The electronic component at the position indicated by said identifying information (i3) is then reclassified, on the basis of the result of the re-determination, into the container corresponding to the quality of said electronic component.

TATEISHI RYOUTA (JP)
TSUBOYAMA KAITO (JP)

PCT/JP2014/066472

December 23, 2015

June 20, 2014

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UENO SEIKI CO LTD (JP)

G01N21/88; G01N21/84; G01R31/26

JP2008076248A	2008-04-03
JP2002031603A	2002-01-31
JP2007327757A	2007-12-20
JP2008111687A	2008-05-15
JP2005010068A	2005-01-13
JP2005044949A	2005-02-17

KIUCHI, MITSUHARU (JP)
Mitsuharu Kiuchi (JP)

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