Title:
ELECTRONIC COMPONENT TRANSPORTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2013/084896
Kind Code:
A1
Abstract:
Provided is an electronic component transporting device that tests the electric characteristics of an electronic component, of which the electric characteristics are to be tested, after heating the electronic component to a desired temperature in advance, wherein the reliability of the test is improved. A heater unit (3) and a test unit (2) are arranged. The heater unit (3) heats an electronic component (P). The test unit (2) tests the electric characteristics of the heated electronic component (P). The heater unit (3) and the test unit (2) are arranged adjacent to one another on a transporting path (1R). An inter-unit heat-retaining cover (4) surrounding the transporting path (1R) and retaining the heat of the electronic component (P) is provided on the transporting path (1R) between the heater unit (3) and the test unit (2).
Inventors:
AZUMA SHINPEI (JP)
Application Number:
PCT/JP2012/081404
Publication Date:
June 13, 2013
Filing Date:
December 04, 2012
Export Citation:
Assignee:
UENO SEIKI CO LTD (JP)
International Classes:
G01R31/26
Foreign References:
| JP2010133716A | 2010-06-17 | |||
| JPS60200600A | 1985-10-11 | |||
| JPH06135547A | 1994-05-17 |
Attorney, Agent or Firm:
KIUCHI, MITSUHARU (JP)
Mitsuharu Kiuchi (JP)
Mitsuharu Kiuchi (JP)
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Claims: