ELECTRONIC DEVICE AND LOCATION MEASUREMENT METHOD USING SAME

Title:

ELECTRONIC DEVICE AND LOCATION MEASUREMENT METHOD USING SAME

Document Type and Number:

WIPO Patent Application WO/2024/049059

Kind Code:

A1

Abstract:

According to an embodiment, an electronic device may comprise: a communication circuit that performs communication with an external electronic device; a memory including map information including location information of a plurality of access points (APs) in a specific area; and a processor. The processor may: on the basis of the map information, determine, as a first group, at least one AP located within the certain distance on the basis of the first location of the electronic device, from among the plurality of APs; on the basis of a signal received from an AP within the first group, determine the first distance between the AP within the first group and the electronic device; on the basis of the map information, determine the second distance between the AP within the first group and the electronic device; determine, as a second group, an AP for which a difference between the first distance and the second distance is less than a certain level, from among the at least one AP within the first group; and determine the second location of the electronic device by using an AP within the second group. The first location may be determined on the basis of signals broadcast by the plurality of access points (APs) in the specific area.

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Inventors:

LEE SANGYOUN (KR)
PARK SINWOO (KR)
HAN KYUHUI (KR)
KIM CHOONGHOON (KR)
NAM YOUNGIL (KR)
KWEON SEJIN (KR)
LEE SEUNGJAE (KR)

Application Number:

PCT/KR2023/012092

Publication Date:

March 07, 2024

Filing Date:

August 16, 2023

Export Citation:

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Assignee:

SAMSUNG ELECTRONICS CO LTD (KR)

International Classes:

G01S5/02; G01S11/06; H04W24/08; H04W64/00

Domestic Patent References:

WO2017156574A1

2017-09-21

Foreign References:

KR20210034270A	2021-03-30
US20220272592A1	2022-08-25
US20100135178A1	2010-06-03
US20130317944A1	2013-11-28

Attorney, Agent or Firm:

YOON & LEE INTERNATIONAL PATENT & LAW FIRM (KR)

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