Title:
EQUIPMENT STATE MONITORING DEVICE AND EQUIPMENT STATE MONITORING METHOD
Document Type and Number:
WIPO Patent Application WO/2022/137368
Kind Code:
A1
Abstract:
An equipment state monitoring device (1) projects a plurality of actual measured data indicating equipment state values into a dimensionless space in which a plurality of display shapes representing a plurality of sets of normal information indicating the normal state of equipment are represented by a common shape, and estimates the distribution of equipment states on the basis of the plurality of actual measured data projected into the dimensionless space. Furthermore, on the basis of the relationship between the actual measured data indicating the normal state of the equipment in the dimensionless space and the display shapes representing the normal information, the normal information and/or the actual measured data in the dimensionless space is corrected.
Inventors:
KURIYAMA TOSHIYUKI (JP)
Application Number:
PCT/JP2020/048073
Publication Date:
June 30, 2022
Filing Date:
December 23, 2020
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
F24F11/30; F25B49/02
Domestic Patent References:
| WO2019058775A1 | 2019-03-28 | |||
| WO2021014638A1 | 2021-01-28 |
Foreign References:
| JPS63297974A | 1988-12-05 | |||
| JP2013155970A | 2013-08-15 |
Attorney, Agent or Firm:
SANNO PATENT ATTORNEYS OFFICE (JP)
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