Title:
ERROR ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/004007
Kind Code:
A1
Abstract:
An error analysis device (10) of the present invention, which is a device for analyzing an error in a facility including a PLC (2), comprises: an acquisition unit (11) that acquires data from a memory of the PLC (2); and an analysis unit (12) that analyzes a state of the PLC (2) when the error occurs on the basis of the data acquired by the acquisition unit (11).
Inventors:
IKEJIRI MASATAKA (JP)
Application Number:
PCT/JP2020/047972
Publication Date:
January 06, 2022
Filing Date:
December 22, 2020
Export Citation:
Assignee:
NIDEC CORP (JP)
International Classes:
G05B23/02; B23Q17/00; G05B19/05
Foreign References:
| JP2011134061A | 2011-07-07 | |||
| JP6625286B1 | 2019-12-25 | |||
| JP4558376B2 | 2010-10-06 |
Download PDF: