Title:
EXTREME HIGH-TEMPERATURE IN-SITU TENON JOINT FRETTING FATIGUE EXPERIMENTAL APPARATUS
Document Type and Number:
WIPO Patent Application WO/2023/226224
Kind Code:
A1
Abstract:
An extreme high-temperature in-situ tenon joint fretting fatigue experimental apparatus, comprising: a loading member (100) used for supporting a tenon test piece (001) and a mortise test piece (002), and applying periodic reciprocating horizontal fatigue load to the tenon test piece (001); a heating member (200) provided below the tenon test piece (001) and the mortise test piece (002) and used for heating the tenon test piece (001) and the mortise test piece (002); a thermal insulation sleeve (300) wrapping the heating member (200); and a control member (400) used for controlling on or off of the loading member (100) and the heating member (200) to apply horizontal fatigue load to the tenon test piece (001) and heating the tenon test piece (001) and the mortise test piece (002). Hot electrons entering a detector are reduced by using a variety of measures, thereby improving the imaging quality of an in-situ scanning electron microscope in an extreme high-temperature environment, and improving the upper limit of experimental temperature. The problem that the high-temperature imaging quality is degraded, the image is whitened, and effective information cannot be observed and the like due to the fact that hot electrons generated by a heating apparatus or a sample in a high-temperature environment interfere with collection of signal electrons performed by the detector is solved.
More Like This:
Inventors:
HAN QINAN (CN)
FANG JIANWEN (CN)
CUI HAITAO (CN)
SU YUE (CN)
ZHANG HONGJIAN (CN)
SHI HUIJI (CN)
FANG JIANWEN (CN)
CUI HAITAO (CN)
SU YUE (CN)
ZHANG HONGJIAN (CN)
SHI HUIJI (CN)
Application Number:
PCT/CN2022/115526
Publication Date:
November 30, 2023
Filing Date:
August 29, 2022
Export Citation:
Assignee:
UNIV NANJING AERONAUTICS & ASTRONAUTICS (CN)
International Classes:
G01N3/36; G01N1/44; G01N3/02; G01N3/04; G01N23/2251
Domestic Patent References:
| WO2014184469A1 | 2014-11-20 |
Foreign References:
| CN114813414A | 2022-07-29 | |||
| CN111443103A | 2020-07-24 | |||
| CN108732035A | 2018-11-02 | |||
| CN207516011U | 2018-06-19 |
Other References:
LIANG JIECUN, HAN QINAN, HE ZHIWU, WANG ZHEN, XIE HONGFU, LI XIDE, SHI HUIJI : "In-situ high-temperature mechanical property measurement technology and its application in scanning electron microscope", SCIENTIA SINICA PHYSICA, MECHANICA & ASTRONOMICA, vol. 48, no. 9, 1 September 2018 (2018-09-01), pages 094606, XP093112411, ISSN: 1674-7275, DOI: 10.1360/SSPMA2018-00148
GIULIANO GREGORI, HANS JOACHIM KLEEBE, FRANK SIEGELIN, GUNTER ZIEGLER: "In situ SEM imaging at temperatures as high as 1450 C", JOURNAL OF ELECTRON MICROSCOPY., JAPANESE SOCIETY FOR ELECTRON MICROSCOPY. TOKYO., JP, vol. 51, no. 6, 1 November 2002 (2002-11-01), JP , pages 347 - 352, XP009550893, ISSN: 0022-0744, DOI: 10.1093/jmicro/51.6.347
GIULIANO GREGORI, HANS JOACHIM KLEEBE, FRANK SIEGELIN, GUNTER ZIEGLER: "In situ SEM imaging at temperatures as high as 1450 C", JOURNAL OF ELECTRON MICROSCOPY., JAPANESE SOCIETY FOR ELECTRON MICROSCOPY. TOKYO., JP, vol. 51, no. 6, 1 November 2002 (2002-11-01), JP , pages 347 - 352, XP009550893, ISSN: 0022-0744, DOI: 10.1093/jmicro/51.6.347
Attorney, Agent or Firm:
TSINGYIHUA INTELLECTUAL PROPERTY LLC (CN)
Download PDF: