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Title:
EYE DIAGRAM OSCILLOSCOPE SYSTEM AND AN EYE DIAGRAM TESTING METHOD
Document Type and Number:
WIPO Patent Application WO/2022/077775
Kind Code:
A1
Abstract:
Disclosed in the content of the present disclosure are an eye diagram oscilloscope system and an eye diagram testing method. The system comprises an equalizer (1), a clock data recovery circuit (2) and an eye diagram oscilloscope (3); after an input signal is adjusted by the equalizer (1), clock information for the clock data recovery circuit (2) to recover the input signal input is inputted, and the clock information and the input signal are inputted into the eye diagram oscilloscope (3); the eye diagram oscilloscope (3) comprises an algorithm logic module (31), a first phase interpolator (32) and a first sampler (33); and the algorithm logic module (31) controls an output clock of the first phase interpolator (32) to traverse N phases, and controls the threshold voltage of the first sampler (33) to traverse M voltage values, thereby testing the bit error rate under each phase and each voltage value, and obtaining an eye diagram of M*N test points. The systems and methods of some embodiments of the content of the present disclosure solve the technical problem of high signal testing costs in the prior art.

Inventors:
HU SHUAISHUAI (CN)
ZHAO JIANZHONG (CN)
LI ZHI (CN)
Application Number:
PCT/CN2020/140579
Publication Date:
April 21, 2022
Filing Date:
December 29, 2020
Export Citation:
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Assignee:
INST OF MICROELECTRONICS OF THE CHINESE ACADEMY OF SCIENCES (CN)
International Classes:
H04L25/03; G01R13/02
Domestic Patent References:
WO2019242571A12019-12-26
Foreign References:
US8744012B12014-06-03
CN104052694A2014-09-17
Attorney, Agent or Firm:
BEIJING BRIGHT & RIGHT LAW FIRM (CN)
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