FAILURE DATA ACQUISITION METHOD, FAILURE HANDLING METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM

Title:

FAILURE DATA ACQUISITION METHOD, FAILURE HANDLING METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM

Document Type and Number:

WIPO Patent Application WO/2023/125059

Kind Code:

A1

Abstract:

Embodiments of the present application provide a failure data acquisition method, a failure handling method, an electronic device, and a storage medium. The failure data acquisition method comprises: acquiring a database failure event and a database failure reason (S100); obtaining label failure data according to the database failure event and the database failure reason (S200); and simulating the database failure event to obtain label-free failure data (S300).

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Inventors:

WANG BINGJIE (CN)

Application Number:

PCT/CN2022/139420

Publication Date:

July 06, 2023

Filing Date:

December 15, 2022

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Assignee:

ZTE CORP (CN)

International Classes:

G06F11/07

Foreign References:

CN112799382A	2021-05-14
CN108153603A	2018-06-12
CN108254678A	2018-07-06
CN111506598A	2020-08-07
US10969429B1	2021-04-06

Attorney, Agent or Firm:

JIAQUAN IP LAW (CN)

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