Title:
FAILURE DIAGNOSIS METHOD, NOISE MEASUREMENT DEVICE, AND FAILURE DIAGNOSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2022/004627
Kind Code:
A1
Abstract:
The present invention determines exactly when a failure occurred in a noise meter. The present invention relates to a noise measurement device 20 comprising: a noise meter 10 having a main microphone 11 capable of measuring noise; and a secondary microphone 21 capable of measuring noise simultaneously with the main microphone 11. The present invention also relates to a failure diagnosis system 1 comprising the noise measurement device 20 and a failure diagnosis device 30 capable of diagnosing a failure of the main microphone 11. The present invention also relates to a failure diagnosis method for diagnosing a failure of the main microphone 11. In the failure diagnosis system 1 and method, the presence or absence of a failure of the main microphone 11 in the noise meter 10 is diagnosed on the basis of comparison of main and secondary noise data respectively obtained by the main and secondary microphones 11, 21 in each of a plurality of recording periods.
Inventors:
KAWAGOE HOSEI (JP)
FUJITA ETSUSHI (JP)
KOHASHI OSAMU (JP)
TADAHIRA YOSHIO (JP)
SUGAYA SHIGEKI (JP)
MIZUNO TAKAHIRO (JP)
SUIDO SHOZO (JP)
OHASHI SHINJI (JP)
FUJITA ETSUSHI (JP)
KOHASHI OSAMU (JP)
TADAHIRA YOSHIO (JP)
SUGAYA SHIGEKI (JP)
MIZUNO TAKAHIRO (JP)
SUIDO SHOZO (JP)
OHASHI SHINJI (JP)
Application Number:
PCT/JP2021/024282
Publication Date:
January 06, 2022
Filing Date:
June 28, 2021
Export Citation:
Assignee:
NIHON ONKYO ENG CO LTD (JP)
International Classes:
G01H17/00; G01H3/00
Domestic Patent References:
| WO2016151716A1 | 2016-09-29 | |||
| WO2019178626A1 | 2019-09-26 |
Foreign References:
| JP2002139377A | 2002-05-17 | |||
| US20150189436A1 | 2015-07-02 | |||
| US20190368337A1 | 2019-12-05 | |||
| JPH0590336U | 1993-12-10 | |||
| JPH01202628A | 1989-08-15 | |||
| JPS62228920A | 1987-10-07 |
Attorney, Agent or Firm:
OKUYAMA, Shoichi et al. (JP)
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