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Patent Searching and Data


Title:
FEATURE VALUE SELECTION METHOD, FEATURE VALUE SELECTION PROGRAM, MULTICLASS CLASSIFICATION METHOD, MULTICLASS CLASSIFICATION PROGRAM, FEATURE VALUE SELECTION DEVICE, MULTICLASS CLASSIFICATION DEVICE, AND FEATURE VALUE SET
Document Type and Number:
WIPO Patent Application WO/2021/161901
Kind Code:
A1
Abstract:
The present invention aims to provide: a multiclass classification method that selects a feature value and classifies a sample into one of a plurality of classes on the basis of the selected feature value; a multiclass classification program; a multiclass classification device; and a feature value selection method, a feature value selection device, and a feature value set that are used in this kind of multiclass classification. The present invention handles issues with multiclass classification that includes feature selection. Feature selection is a method whereby feature values required for latter-stage processes (i.e., multiclass classification, for this invention) are selected for adoption or rejection beforehand, from among a plurality of feature values in a sample. Multiclass classification is an issue of discrimination that determines which of a plurality of classes a given unknown sample belongs to.

Inventors:
NAGASE MASAYA (JP)
Application Number:
PCT/JP2021/004193
Publication Date:
August 19, 2021
Filing Date:
February 05, 2021
Export Citation:
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Assignee:
FUJIFILM CORP (JP)
International Classes:
G06T7/00; G01N33/50; G06F16/906; G06N20/00; G16B40/20
Domestic Patent References:
WO2008139825A12008-11-20
WO2012111235A12012-08-23
Foreign References:
JP2012123782A2012-06-28
JP2011181016A2011-09-15
Attorney, Agent or Firm:
MATSUURA, Kenzo (JP)
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