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Title:
FILM DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND RELEASE FILM
Document Type and Number:
WIPO Patent Application WO/2011/148790
Kind Code:
A1
Abstract:
Disclosed is a film defect inspection device for detecting defects in a long-length film, the inspection device including: an illumination means that is provided on the side of one surface of the film and that illuminates same; a first polarizing plate that is provided between the illumination means and the film; a second polarizing plate that is provided on the side of the other surface of the film; a light-receiving means that is provided on the side of the other surface of the film and that receives transmitted light which has been emitted from the illumination means and which has passed through the first polarizing plate, the film, and the second polarizing plate; and an angle adjustment means that separately adjusts the angle of the first polarizing plate within the plane thereof and the angle of the second polarizing plate within the plane thereof.

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Inventors:
UEKI KATSUYUKI (JP)
MIYAHARA KAZUHISA (JP)
Application Number:
PCT/JP2011/060954
Publication Date:
December 01, 2011
Filing Date:
May 12, 2011
Export Citation:
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Assignee:
TORAY INDUSTRIES (JP)
UEKI KATSUYUKI (JP)
MIYAHARA KAZUHISA (JP)
International Classes:
G01N21/892; G01N21/89
Foreign References:
JP2008008787A2008-01-17
JP2006047143A2006-02-16
JP2009025270A2009-02-05
JPH09136323A1997-05-27
JP2002071582A2002-03-08
JP2008155435A2008-07-10
JP2009199023A2009-09-03
JP2009199024A2009-09-03
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Claims:



 
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