Title:
FILM FORMATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/230072
Kind Code:
A1
Abstract:
Provided is a film formation device which controls plasma. This film formation device is provided with: a reactive gas supply unit for supplying a reactive gas to a first chamber; a source gas supply unit for supplying a source gas to a second chamber; a first plasma mechanism for generating inductively coupled plasma which activates the reactive gas; a second plasma mechanism for generating capacitively coupled plasma which activates the reactive gas activated by the first plasma mechanism, and the source gas; and a control unit, wherein the second plasma mechanism includes: an upper electrode; a lower electrode which pairs with the upper electrode; a first high-frequency power source which applies a high-frequency wave to the upper electrode via a first matching device; a second high-frequency power source which applies a high-frequency wave to the upper electrode via a second matching device; and a third matching device which is connected to the lower electrode, the third matching device including a variable capacitor.
Inventors:
PARK TAEHOON (KR)
WON JAIHYUNG (KR)
LEE NAEIL (KR)
PARK JINHYUNG (KR)
BAIK CHOONKUM (KR)
LIM HYONAM (KR)
WON JAIHYUNG (KR)
LEE NAEIL (KR)
PARK JINHYUNG (KR)
BAIK CHOONKUM (KR)
LIM HYONAM (KR)
Application Number:
PCT/JP2021/016854
Publication Date:
November 03, 2022
Filing Date:
April 27, 2021
Export Citation:
Assignee:
TOKYO ELECTRON LTD (JP)
International Classes:
H01L21/31
Domestic Patent References:
WO2009005148A1 | 2009-01-08 |
Foreign References:
JP2015019065A | 2015-01-29 | |||
JP2016145385A | 2016-08-12 | |||
JP2013251546A | 2013-12-12 | |||
JP2011124295A | 2011-06-23 | |||
JP2003119564A | 2003-04-23 | |||
JP2020155387A | 2020-09-24 | |||
US10593518B1 | 2020-03-17 |
Attorney, Agent or Firm:
ITOH, Tadashige et al. (JP)
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