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Patent Searching and Data


Title:
FILM FORMATION DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/230072
Kind Code:
A1
Abstract:
Provided is a film formation device which controls plasma. This film formation device is provided with: a reactive gas supply unit for supplying a reactive gas to a first chamber; a source gas supply unit for supplying a source gas to a second chamber; a first plasma mechanism for generating inductively coupled plasma which activates the reactive gas; a second plasma mechanism for generating capacitively coupled plasma which activates the reactive gas activated by the first plasma mechanism, and the source gas; and a control unit, wherein the second plasma mechanism includes: an upper electrode; a lower electrode which pairs with the upper electrode; a first high-frequency power source which applies a high-frequency wave to the upper electrode via a first matching device; a second high-frequency power source which applies a high-frequency wave to the upper electrode via a second matching device; and a third matching device which is connected to the lower electrode, the third matching device including a variable capacitor.

Inventors:
PARK TAEHOON (KR)
WON JAIHYUNG (KR)
LEE NAEIL (KR)
PARK JINHYUNG (KR)
BAIK CHOONKUM (KR)
LIM HYONAM (KR)
Application Number:
PCT/JP2021/016854
Publication Date:
November 03, 2022
Filing Date:
April 27, 2021
Export Citation:
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Assignee:
TOKYO ELECTRON LTD (JP)
International Classes:
H01L21/31
Domestic Patent References:
WO2009005148A12009-01-08
Foreign References:
JP2015019065A2015-01-29
JP2016145385A2016-08-12
JP2013251546A2013-12-12
JP2011124295A2011-06-23
JP2003119564A2003-04-23
JP2020155387A2020-09-24
US10593518B12020-03-17
Attorney, Agent or Firm:
ITOH, Tadashige et al. (JP)
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