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Patent Searching and Data


Title:
FILTER FOR CAPTURING FINE PARTICLES AND METHOD FOR MANUFACTURING FILTER FOR CAPTURING FINE PARTICLES
Document Type and Number:
WIPO Patent Application WO/2022/209115
Kind Code:
A1
Abstract:
A filter for capturing fine particles, the filter having: a transparent body having first and second surfaces, and a thickness of 50 μm or more; and, a plurality of through-holes that penetrate from the first surface of the body to the second surface. When a position 10 μm in depth from the second surface is defined as a reference depth DS and, in each through-hole, the minimum cross-sectional dimension at the reference depth DS is φP and the minimum cross-sectional dimension between the reference depth DS and the second surface is φQ, φQ ≦ 0.6 μm and φQ / φP ≦ 0.5.

Inventors:
IWATA DAIJIRO (JP)
MASHIMO TAKAHIRO (JP)
TATSUKOSHI KENTARO (JP)
ODAKA HIDEFUMI (JP)
Application Number:
PCT/JP2022/000434
Publication Date:
October 06, 2022
Filing Date:
January 07, 2022
Export Citation:
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Assignee:
AGC INC (JP)
International Classes:
B01D39/20; B01D39/16; B23K26/382; C03B33/09
Foreign References:
JP2014147893A2014-08-21
JPH0243927A1990-02-14
JP2003526497A2003-09-09
JP2013215668A2013-10-24
JP2007508141A2007-04-05
US6295986B12001-10-02
CN108079665A2018-05-29
Attorney, Agent or Firm:
ITOH, Tadashige et al. (JP)
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