Title:
FINE PARTICLE DETECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2016/024429
Kind Code:
A1
Abstract:
A fine particle detection device of the present invention comprises a specimen chip (7) having a specimen injection part into which a specimen including fine particles is injected; a light source (8); an irradiation optical system (1) that irradiates the specimen with light from the light source (8); a photodetection optical system (2, 13 to 27) that detects light emitted from the fine particles due to the irradiation of light; and a detector that detects the fine particles on the basis of the strength of the light from the fine particles. The photodetection optical system (2, 13 to 27) has an objective lens element (2) that transmits light from the light source (8) toward the specimen while condensing light emitted from the fine particles. The objective lens element (2) has a beam light transmission part having a shape that condenses light from the light source (8) toward the specimen. When the thickness of the specimen injection part is D, the wavelength of irradiation light from the light source (8) is λ, and a rate of decrease in beam radius of irradiation light in the beam light transmission part is R, a relational expression D≤λ/R2 is satisfied.
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Inventors:
TANAKA MASAKI
Application Number:
PCT/JP2015/065302
Publication Date:
February 18, 2016
Filing Date:
May 27, 2015
Export Citation:
Assignee:
SHARP KK (JP)
International Classes:
G01N21/64; G01N15/02; G01N15/14; G01N21/03; G01N21/49
Domestic Patent References:
| WO2013146364A1 | 2013-10-03 |
Foreign References:
| JP2011059095A | 2011-03-24 | |||
| JP2012198236A | 2012-10-18 | |||
| JP2013521499A | 2013-06-10 | |||
| JP2005337982A | 2005-12-08 | |||
| JP2007003249A | 2007-01-11 | |||
| US20030036855A1 | 2003-02-20 | |||
| US20030030850A1 | 2003-02-13 |
Attorney, Agent or Firm:
SAMEJIMA, Mutsumi et al. (JP)
Mutsumi Sameshima (JP)
Mutsumi Sameshima (JP)
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