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Patent Searching and Data


Title:
FLICKER MEASURING DEVICE, FLICKER MEASURING METHOD, AND FLICKER MEASURING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2020/166201
Kind Code:
A1
Abstract:
A flicker measuring device according to the present invention: receives light emitted from an object being measured, and outputs a light reception signal corresponding to a received light intensity; during a period from a measuring start time point until a steady time point at which the object being measured adopts a steady state, acquires the output light reception signal a plurality of times; on the basis of the acquired light reception signals, obtains flicker values of the object being measured, and stores each obtained flicker value in a storage unit in association with the time point at which the light reception signal was acquired; and performs arithmetic processing to obtain a flicker shift time using the stored flicker values; wherein, in the arithmetic processing, the flicker measuring device obtains an overall amount of change, which is an amount of change in the flicker value from an initial flicker value to a steady flicker value, obtains a prescribed proportion time point at which the amount of change in the flicker value from a reference flicker value is a prescribed proportion of the overall amount of change, and obtains an elapsed time between the prescribed proportion time point and a reference time point as the flicker shift time.

Inventors:
NISHIKAWA YOSHIHIRO (JP)
Application Number:
PCT/JP2019/049721
Publication Date:
August 20, 2020
Filing Date:
December 19, 2019
Export Citation:
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Assignee:
KONICA MINOLTA INC (JP)
International Classes:
H04N17/04; G01J1/44; G01M11/00; G02F1/13; G09G5/00
Foreign References:
JP2017116820A2017-06-29
JP2011221218A2011-11-04
JP2009163090A2009-07-23
JP2011248077A2011-12-08
JP2004317450A2004-11-11
Attorney, Agent or Firm:
KOTANI, Etsuji et al. (JP)
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