Title:
FOREIGN MATTER INSPECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2017/057740
Kind Code:
A1
Abstract:
A foreign matter inspection device is provided with a conveying unit, an x-ray inspection unit, a metal detection unit, a housing having an entry opening and an exit opening, a first x-ray shielding curtain provided at the entry opening, and a second x-ray shielding curtain provided at the exit opening. A case has a main body within which a search coil is disposed, a first hood part provided on the entry opening side of the main body, and a second hood part provided on the exit opening side of the main body. The first x-ray shielding curtain is shorter than the distance from the upper end thereof to the main body via the first hood part. The second x-ray shielding curtain is shorter than the distance from the upper end thereof to the main body via the second hood part.
More Like This:
| JP2017157536 | X-RAY GENERATING APPARATUS AND X-RAY IMAGING APPARATUS |
| JPH0694651 | SUBSTRATE INSPECTOR |
| JP2590735 | [Name of invention] Pipe fitting inspection device |
Inventors:
ICHIHARA AKIRA (JP)
NAKASHIMA TAKAHIRO (JP)
NAKASHIMA TAKAHIRO (JP)
Application Number:
PCT/JP2016/079144
Publication Date:
April 06, 2017
Filing Date:
September 30, 2016
Export Citation:
Assignee:
ISHIDA SEISAKUSHO (JP)
NISSIN ELECTRONICS CO LTD (JP)
NISSIN ELECTRONICS CO LTD (JP)
International Classes:
G01N23/18; G01N23/04; G01N27/72
Domestic Patent References:
| WO2005043149A1 | 2005-05-12 |
Foreign References:
| JP2015028465A | 2015-02-12 | |||
| JP2015028464A | 2015-02-12 |
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
Download PDF: