FREQUENCY CHARACTERISTIC MEASUREMENT APPARATUS AND FREQUENCY CHARACTERISTIC MEASUREMENT METHOD

WIPO Patent Application WO/2023/074151

A1

The present invention is for measuring frequency characteristics with high accuracy. A frequency characteristic measurement apparatus (10) is provided with a first output unit (11), a frequency characteristic calculation unit (13), a resonance frequency calculation unit (14), and a second output unit (12). The frequency characteristic calculation unit (13) calculates a first frequency characteristic of a servo system (20) on the basis of a first vibration signal that is from a first output unit (11) and that is within a first frequency range, and a first state signal acquired from the servo system (20) to which the first vibration signal has been inputted. The resonance frequency calculation unit (14) calculates a resonance frequency or an anti-resonance frequency of the servo system (20) on the basis of the first frequency characteristic. The second output unit (12) outputs a second vibration signal within a second frequency range that includes the resonance frequency or the anti-resonance frequency. The frequency characteristic calculation unit (13) calculates a second frequency characteristic of the servo system (20) on the basis of the second vibration signal and a second state signal acquired from the servo system (20) to which the second vibration signal has been inputted.

SHIRAKI YUTA
FUJIWARA HIROSHI
TAZAWA TORU

PCT/JP2022/033965

May 04, 2023

September 09, 2022

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PANASONIC IP MAN CO LTD (JP)

H02P29/00; G05D3/12

JP2000278990A	2000-10-06
JP2009092398A	2009-04-30

KAMATA Kenji et al. (JP)

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