FRESNEL ZONE PLATE AND X-RAY MICROSCOPE USING THE FRESNEL ZONE PLATE

Title:

FRESNEL ZONE PLATE AND X-RAY MICROSCOPE USING THE FRESNEL ZONE PLATE

Document Type and Number:

WIPO Patent Application WO/2006/115114

Kind Code:

A1

Abstract:

[PROBLEMS] To provide a Fresnel zone plate having a complex irradiation function capable of improving resolution even when the outermost opaque band width cannot be reduced and an X-ray microscope using the Fresnel zone plane. [MEANS FOR SOLVING PROBLEMS] A Fresnel zone plate (1) having complex irradiation function have opaque bands (3) and transparent bands (4) arranged alternately in the radial direction from the center of a flat transparent substrate (2). The Fresnel zone plate have a transmission widow (7) so that a part of plane wave vertically applied onto the upper surface of the substrate (2) vertically advances directly to a sample (6) arranged below the Fresnel zone plate (1).

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Inventors:

ENDOH HISAMITSU (JP)

Application Number:

PCT/JP2006/308108

Publication Date:

November 02, 2006

Filing Date:

April 18, 2006

Export Citation:

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Assignee:

KYOTO INST OF TECHNOLOGY (JP)
ENDOH HISAMITSU (JP)

International Classes:

G21K1/06; G01N23/04; G02B5/18; G02B21/00; G21K7/00

Foreign References:

JPH0274811A	1990-03-14
JP2002535699A	2002-10-22

Attorney, Agent or Firm:

Watanabe, Mitsuhiko (11-8 Sonezaki 2-chome, Kita-k, Osaka-shi Osaka 57, JP)

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