Title:
GRAIN-SIZE MEASUREMENT
Document Type and Number:
WIPO Patent Application WO2002103347
Kind Code:
A3
Abstract:
Grain sizes, for example in a sheet (12), are monitored by generating broadband ultrasonic waves with a pulse laser generator (14) at a first location (18) on a surface of the object, and observing with a laser detectro (20, 36) the waves on the surface at a different location (A). The ultrasonic spectrum for those waves that arrive at arrival times after that of the Rayleigh waves or the start of the A0 Lamb waves is determined, and the high frequency power is compared to the low frequency power. This ratio gives a consistent relationship to grain sizes. With copper sheets the frequency windows may be 1 to 3 MHz as the low frequency region, and 2.2 to 15 MHz as the high frequency region.
Inventors:
SMITH ALLAN PETER (GB)
SCRUBY CHRISTOPHER BRIAN (GB)
MOSS BRIAN CECIL (GB)
SCRUBY CHRISTOPHER BRIAN (GB)
MOSS BRIAN CECIL (GB)
Application Number:
PCT/GB2002/002716
Publication Date:
April 24, 2003
Filing Date:
June 12, 2002
Export Citation:
Assignee:
ACCENTUS PLC (GB)
SMITH ALLAN PETER (GB)
SCRUBY CHRISTOPHER BRIAN (GB)
MOSS BRIAN CECIL (GB)
SMITH ALLAN PETER (GB)
SCRUBY CHRISTOPHER BRIAN (GB)
MOSS BRIAN CECIL (GB)
International Classes:
G01N29/24; G01N29/30; G01N29/42; G01N29/46; (IPC1-7): G01N29/24; G01N21/17
Foreign References:
| US5804727A | 1998-09-08 | |||
| US5608166A | 1997-03-04 | |||
| GB2172106A | 1986-09-10 |
Other References:
PATENT ABSTRACTS OF JAPAN vol. 005, no. 118 (P - 073) 30 July 1981 (1981-07-30)
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