Title:
IMAGE ANALYSIS APPARATUS AND METHOD
Document Type and Number:
WIPO Patent Application WO/2020/091337
Kind Code:
A1
Abstract:
An image analysis method according to an embodiment of the present invention comprises the steps of: receiving an image to be analyzed with respect to an object including at least one entity; obtaining control information for detecting the at least one entity; analyzing the image to be analyzed by using the control information and a deep learning-based model; and outputting an image of the analyzed result, wherein the control information includes operation mode information, and when the operation mode information indicates a busy mode, the image to be analyzed may be a streaming image with respect to the object and when the operation mode information indicates a non-busy mode, the image to be analyzed may be a single picture with respect to the object.
Inventors:
KIM WON TAE (KR)
KANG SHIN UK (KR)
LEE MYUNG JAE (KR)
KIM DONG MIN (KR)
KIM PIL SOO (KR)
KANG SHIN UK (KR)
LEE MYUNG JAE (KR)
KIM DONG MIN (KR)
KIM PIL SOO (KR)
Application Number:
PCT/KR2019/014265
Publication Date:
May 07, 2020
Filing Date:
October 28, 2019
Export Citation:
Assignee:
JLK INSPECTION INC (KR)
International Classes:
G06T7/00; G06N3/08; G06T7/11
Domestic Patent References:
WO2010138574A1 | 2010-12-02 |
Foreign References:
JP2018112550A | 2018-07-19 | |||
KR20160034385A | 2016-03-29 | |||
JP2006518039A | 2006-08-03 | |||
JP2002257751A | 2002-09-11 |
Attorney, Agent or Firm:
SUNG, Byung Kee (KR)
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