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Patent Searching and Data


Title:
IMAGE ANALYSIS APPARATUS AND METHOD
Document Type and Number:
WIPO Patent Application WO/2020/091337
Kind Code:
A1
Abstract:
An image analysis method according to an embodiment of the present invention comprises the steps of: receiving an image to be analyzed with respect to an object including at least one entity; obtaining control information for detecting the at least one entity; analyzing the image to be analyzed by using the control information and a deep learning-based model; and outputting an image of the analyzed result, wherein the control information includes operation mode information, and when the operation mode information indicates a busy mode, the image to be analyzed may be a streaming image with respect to the object and when the operation mode information indicates a non-busy mode, the image to be analyzed may be a single picture with respect to the object.

Inventors:
KIM WON TAE (KR)
KANG SHIN UK (KR)
LEE MYUNG JAE (KR)
KIM DONG MIN (KR)
KIM PIL SOO (KR)
Application Number:
PCT/KR2019/014265
Publication Date:
May 07, 2020
Filing Date:
October 28, 2019
Export Citation:
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Assignee:
JLK INSPECTION INC (KR)
International Classes:
G06T7/00; G06N3/08; G06T7/11
Domestic Patent References:
WO2010138574A12010-12-02
Foreign References:
JP2018112550A2018-07-19
KR20160034385A2016-03-29
JP2006518039A2006-08-03
JP2002257751A2002-09-11
Attorney, Agent or Firm:
SUNG, Byung Kee (KR)
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