Title:
IMAGE ANALYSIS SYSTEM, IMAGE ANALYSIS METHOD, AND IMAGE ANALYSIS PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/193101
Kind Code:
A1
Abstract:
Provided are an image analysis system, an image analysis method, and an image analysis program that make it possible to monitor the state of a specific object and quickly detect and report an abnormality without increasing the amount of processing. The image analysis system, the image analysis method, and the image analysis program are for monitoring the state of an object (a monitored object) present in a monitoring area. An image analysis server 1 divides an image of the area into a plurality of grids, creates a learned model obtained by learning, for each grid in which the monitored object is expected to be present, an image in which the monitored object is present and an image in which the monitored object is not present, and subsequently uses the learned model as a basis to determine whether the monitored object is present within the grids in an input image. It is thus possible to detect the state of a monitored object by simple processing of each grid.
Inventors:
HASEGAWA KEIGO (JP)
ITO WATARU (JP)
IWANAGA KAZUNARI (JP)
ITO WATARU (JP)
IWANAGA KAZUNARI (JP)
Application Number:
PCT/JP2021/009791
Publication Date:
September 30, 2021
Filing Date:
March 11, 2021
Export Citation:
Assignee:
HITACHI INT ELECTRIC INC (JP)
International Classes:
G08B25/00; G06T7/00; H04N7/18
Foreign References:
| JP2018072938A | 2018-05-10 | |||
| JP2019139618A | 2019-08-22 |
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