Title:
IMAGE CORRECTION METHOD IN ELECTRON ENDOSCOPE SYSTEM
Document Type and Number:
WIPO Patent Application WO/2024/024411
Kind Code:
A1
Abstract:
An embodiment of the present invention is a correction method for correcting a captured image in an electron endoscope system. This method includes: a step for using a reference endoscope and a reference processor to calculate a first corrective parameter corresponding to a processor to be corrected; a step for storing the calculated first corrective parameter in the processor to be corrected; a step for using the reference endoscope and the reference processor to calculate a second corrective parameter corresponding to an endoscope to be corrected; a step for storing the calculated second corrective parameter in the endoscope to be corrected; and a step in which, when the endoscope to be corrected and the processor to be corrected are connected, the processor to be corrected performs a correction in which the first corrective parameter and the second corrective parameter are used, on a captured image captured by the imaging element of the endoscope to be corrected.
Inventors:
MAKINO TAKAO (JP)
Application Number:
PCT/JP2023/024657
Publication Date:
February 01, 2024
Filing Date:
July 03, 2023
Export Citation:
Assignee:
HOYA CORP (JP)
International Classes:
A61B1/00; A61B1/045
Domestic Patent References:
| WO2019239854A1 | 2019-12-19 | |||
| WO2021118844A1 | 2021-06-17 | |||
| WO2018043728A1 | 2018-03-08 | |||
| WO2020049688A1 | 2020-03-12 | |||
| WO2013132725A1 | 2013-09-12 |
Foreign References:
| JP2012213612A | 2012-11-08 | |||
| JP2017144247A | 2017-08-24 | |||
| JP2022053845A | 2022-04-06 | |||
| JP2017196430A | 2017-11-02 | |||
| JP2018023497A | 2018-02-15 |
Attorney, Agent or Firm:
GLOBAL IP TOKYO (JP)
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