Title:
IMAGING DEVICE, INSPECTION DEVICE, AND INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2021/095785
Kind Code:
A1
Abstract:
According to the present invention, the printing state of a target surface of an inspection target is easily and accurately grasped. Provided is an imaging device 5 that photographs the printing state of the target surface W1 of the inspection target, the imaging device 5 comprising: a first light source 20; a diffuser cylinder 10 that has an inner peripheral surface 11 covered with a diffuse reflection agent, diffuses and reflects light emitted from the first light source, and emits the diffused reflected light to the target surface; and a line sensor 40 that receives light reflected from the target surface by the diffused reflected light.
Inventors:
SHIRASAKA TATSUYA (JP)
TOCHIGI TAKAYUKI (JP)
HATANO OSAMU (JP)
TOCHIGI TAKAYUKI (JP)
HATANO OSAMU (JP)
Application Number:
PCT/JP2020/042141
Publication Date:
May 20, 2021
Filing Date:
November 11, 2020
Export Citation:
Assignee:
TOYO SEIKAN KAISHA LTD (JP)
International Classes:
G01J3/51; G01N21/892
Foreign References:
US20130271764A1 | 2013-10-17 | |||
JPH0814846A | 1996-01-19 | |||
JPH06331564A | 1994-12-02 | |||
JPS6438637A | 1989-02-08 | |||
JPH09300596A | 1997-11-25 |
Attorney, Agent or Firm:
EBISU INTERNATIONAL PATENT OFFICE (JP)
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